Hochschulschrift
Enabling functional tests of asynchronous circuits using a test processor solution
- Alternative title
-
Realisierung von Funktionaltests asynchroner Schaltungen unter Verwendung einer Testprozessorlösung
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
Cottbus, Brandenburgische Technische Universität Cottbus, Diss., 2013
- Classification
-
Elektrotechnik, Elektronik
- Keyword
-
Asynchrones Schaltwerk ; Prüftechnik ; Fehlererkennung
- Event
-
Veröffentlichung
- (where)
-
Cottbus
- (who)
-
Universitätsbibliothek der BTU Cottbus
- (when)
-
2014
- Creator
- Contributor
-
Kraemer, Rolf
- URN
-
urn:nbn:de:kobv:co1-opus-29643
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:46 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Hochschulschrift
Associated
- Zeidler, Steffen
- Kraemer, Rolf
- Universitätsbibliothek der BTU Cottbus
Time of origin
- 2014
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Fault simulation for asynchronous circuits
The pseudoexhaustive test of sequential circuits
Attacking complexity in logic synthesis of asynchronous circuits
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The pseudo-exhaustive test of sequential circuits
Enabling techniques for Si integrated transceiver circuits
Test and diagnosis of embedded processor cores with formal methods
HVDC Circuit Breakers -- Test Requirements, Methods and Circuits
Signature analysis and test scheduling for self-testable circuits
Built-in self-tests for 77ghz radar integrated circuits
Enabling functional tests of asynchronous circuits using a test processor solution
Asynchronous circuits
Fault simulation for asynchronous circuits
The pseudoexhaustive test of sequential circuits
Attacking complexity in logic synthesis of asynchronous circuits
VMEbus Controller Synthesis by Communicating Asynchronous Sequential Circuits
The pseudo-exhaustive test of sequential circuits
Enabling techniques for Si integrated transceiver circuits
Test and diagnosis of embedded processor cores with formal methods
HVDC Circuit Breakers -- Test Requirements, Methods and Circuits
Signature analysis and test scheduling for self-testable circuits