- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
In: Meeting the tests of time : International Test Conference 1989. Washington, DC : IEEE Computer Soc. Pr., 1989. - ISBN 0-8186-8962-5, S. 19-27. URL http://dx.doi.org./ 10.1109/TEST.1989.82273
- Classification
-
Elektrotechnik, Elektronik
- Keyword
-
Testbarkeit ; Flip-Flop ; Fehlermodell
- Event
-
Veröffentlichung
- (where)
-
Stuttgart
- (who)
-
Universitätsbibliothek der Universität Stuttgart
- (when)
-
2012
- Creator
- URN
-
urn:nbn:de:bsz:93-opus-73342
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:48 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Wunderlich, Hans-Joachim
- Hellebrand, Sybille
- Universitätsbibliothek der Universität Stuttgart
Time of origin
- 2012
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