- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
1573-0727
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
online resource.
- Erschienen in
-
Test Flow Selection for Stacked Integrated Circuits ; volume:35 ; number:4 ; day:14 ; month:8 ; year:2019 ; pages:425-440 ; date:8.2019
Journal of electronic testing ; 35, Heft 4 (14.8.2019), 425-440, 8.2019
- Klassifikation
-
Elektrotechnik, Elektronik
- Urheber
-
SenGupta, Breeta
Nikolov, Dimitar
Dash, Assmitra
Larsson, Erik
- Beteiligte Personen und Organisationen
-
SpringerLink (Online service)
- DOI
-
10.1007/s10836-019-05813-z
- URN
-
urn:nbn:de:101:1-2020012418372141704618
- Rechteinformation
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 10:59 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- SenGupta, Breeta
- Nikolov, Dimitar
- Dash, Assmitra
- Larsson, Erik
- SpringerLink (Online service)
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