Comparative Study of Reliability of Ferroelectric and Anti-Ferroelectric Memories
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
In: IEEE transactions on device and materials reliability. 2018, 18(2), S. 154-162 . IEEE. ISSN 1558-2574.
- Event
-
Veröffentlichung
- (where)
-
Dresden
- (who)
-
Technische Universität Dresden
- (when)
-
2021
- Creator
-
Pešić, Milan
Schroeder, Uwe
Slesazeck, Stefan
Mikolajick, Thomas
- URN
-
urn:nbn:de:bsz:14-qucosa2-767094
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:53 PM CET
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Pešić, Milan
- Schroeder, Uwe
- Slesazeck, Stefan
- Mikolajick, Thomas
- Technische Universität Dresden
Time of origin
- 2021
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