- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783527335015
3527335013
- Dimensions
-
24 cm
- Extent
-
XX, 303 S.
- Language
-
Englisch
- Notes
-
Ill., graph. Darst.
Literaturangaben
- Classification
-
Elektrotechnik, Elektronik
- Keyword
-
MEMS
Zuverlässigkeit
- Event
-
Veröffentlichung
- (where)
-
Weinheim
- (who)
-
Wiley-VCH
- (when)
-
2013
- Contributor
-
Tabata, Osamu
Brand, Oliver
Fedder, Gary K.
Hierold, Christofer
Korvink, Jan G.
Tsuchiya, Toshiyuki
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.06.2025, 1:36 PM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Tabata, Osamu
- Brand, Oliver
- Fedder, Gary K.
- Hierold, Christofer
- Korvink, Jan G.
- Tsuchiya, Toshiyuki
- Wiley-VCH
Time of origin
- 2013
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Reliability aspects of electronic devices for advanced requirements
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