Hochschulschrift
Reliability Investigations of MOSFETs using RF Small Signal Characterization
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
Dresden, Technische Universität Dresden, Dissertation, 2023
- Classification
-
Elektrotechnik, Elektronik
- Keyword
-
MOS-FET
CMOS
Degradation
- Event
-
Veröffentlichung
- (where)
-
Dresden
- (who)
-
Technische Universität Dresden
- (when)
-
2023
- Creator
- Contributor
- URN
-
urn:nbn:de:bsz:14-qucosa2-871411
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:45 PM CET
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Hochschulschrift
Associated
- Chohan, Talha
- Mikolajick, Thomas
- Schmitz, Jurriaan
- Technische Universität Dresden
Time of origin
- 2023
Other Objects (12)
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Reliability of advanced ceramics : macro- and mesoscale investigations
Frequency preference and reliability of signal integration
Transporteigenschaften in Si1-χ Geχ-p-MOSFETs [Si1-chi Ge-chi-p-MOSFETs]
Eindimensionale Modellierung von SOI-MOSFETs
Modellierung des ladungskompensierten Leistungs-MOSFETs
Eindimensionale Modellierung von SOI-MOSFETs
Kompensationsstrukturen für laterale Leistungs-MOSFETs
Reliability investigations of MOSFETs using RF small signal characterization
Impact of BTI Stress on RF Small Signal Parameters of FDSOI MOSFETs
Ultra small SOI DG MOSFETs and RF MEMS applications
Physical investigations of novel materials and structures for nano-MOSFETs
DC and RF characterization of NiSi Schottky Barrier MOSFETs with dopant segregation
Reliability of advanced ceramics : macro- and mesoscale investigations
Frequency preference and reliability of signal integration
Transporteigenschaften in Si1-χ Geχ-p-MOSFETs [Si1-chi Ge-chi-p-MOSFETs]
Eindimensionale Modellierung von SOI-MOSFETs
Modellierung des ladungskompensierten Leistungs-MOSFETs
Eindimensionale Modellierung von SOI-MOSFETs
Kompensationsstrukturen für laterale Leistungs-MOSFETs
Reliability investigations of MOSFETs using RF small signal characterization
Impact of BTI Stress on RF Small Signal Parameters of FDSOI MOSFETs
Ultra small SOI DG MOSFETs and RF MEMS applications
Physical investigations of novel materials and structures for nano-MOSFETs
DC and RF characterization of NiSi Schottky Barrier MOSFETs with dopant segregation
Reliability of advanced ceramics : macro- and mesoscale investigations
Frequency preference and reliability of signal integration
Transporteigenschaften in Si1-χ Geχ-p-MOSFETs [Si1-chi Ge-chi-p-MOSFETs]
Eindimensionale Modellierung von SOI-MOSFETs
Modellierung des ladungskompensierten Leistungs-MOSFETs
Eindimensionale Modellierung von SOI-MOSFETs