Model based prediction of the trap limited diffusion of hydrogen in post-hydrogenated amorphous silicon
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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In: Physica Status Solidi (RRL) - Rapid Research Letters ; 10 (2016), 11. - S. 828-832. - ISSN 1862-6270. - eISSN 1862-6254
- Event
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Veröffentlichung
- (where)
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Konstanz
- (who)
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KOPS Universität Konstanz
- (when)
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2016
- Creator
- URN
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urn:nbn:de:bsz:352-2-7wwgke37rf4d3
- Rights
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:31 AM CEST
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Gerke, Sebastian
- Becker, Hans-Werner
- Rogalla, Detlef
- Job, Reinhart
- Terheiden, Barbara
- KOPS Universität Konstanz
Time of origin
- 2016
Other Objects (12)
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Occurrence of Sharp Hydrogen Effusion Peaks of Hydrogenated Amorphous Silicon Film and Its Connection to Void Structures
Changes in passivation quality of PECV-deposited hydrogenated amorphous silicon layers used in solar cells due to sputter deposition of TCOs
Occurrence of Sharp Hydrogen Effusion Peaks of Hydrogenated Amorphous Silicon Film and Its Connection to Void Structures
CVD Boron Containing Glasses - An Attractive Alternative Diffusion Source for High Quality Emitters and Simplified Processing : A Review
Influence of the electrodes' distance upon the electrical, optical and structural properties of PECV-deposited hydrogenated amorphous silicon films for heterojunction solar cell application
Bias-plasma Assisted RF Magnetron Sputter Deposition of Hydrogen-less Amorphous Silicon
Electrical, optical and structural investigation of low-temperature PECV-deposited hydrogenated amphorous silicon-oxynitride films for surface passivation of crystalline silicon solar cells
Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films
Morphology and Hydrogen in Passivating Amorphous Silicon Layers
About Nuclear Resonant Reaction Analysis for Hydrogen Investigations in Amorphous Silicon
Entwicklung und Charakterisierung neuartiger Hochleistungssolarzellen
Correlation between the optical bandgap and the monohydride bond density of hydrogenated amorphous silicon
Occurrence of Sharp Hydrogen Effusion Peaks of Hydrogenated Amorphous Silicon Film and Its Connection to Void Structures
Changes in passivation quality of PECV-deposited hydrogenated amorphous silicon layers used in solar cells due to sputter deposition of TCOs
Occurrence of Sharp Hydrogen Effusion Peaks of Hydrogenated Amorphous Silicon Film and Its Connection to Void Structures
CVD Boron Containing Glasses - An Attractive Alternative Diffusion Source for High Quality Emitters and Simplified Processing : A Review
Influence of the electrodes' distance upon the electrical, optical and structural properties of PECV-deposited hydrogenated amorphous silicon films for heterojunction solar cell application
Bias-plasma Assisted RF Magnetron Sputter Deposition of Hydrogen-less Amorphous Silicon
Electrical, optical and structural investigation of low-temperature PECV-deposited hydrogenated amphorous silicon-oxynitride films for surface passivation of crystalline silicon solar cells
Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films
Morphology and Hydrogen in Passivating Amorphous Silicon Layers
About Nuclear Resonant Reaction Analysis for Hydrogen Investigations in Amorphous Silicon
Entwicklung und Charakterisierung neuartiger Hochleistungssolarzellen
Correlation between the optical bandgap and the monohydride bond density of hydrogenated amorphous silicon
Occurrence of Sharp Hydrogen Effusion Peaks of Hydrogenated Amorphous Silicon Film and Its Connection to Void Structures
Changes in passivation quality of PECV-deposited hydrogenated amorphous silicon layers used in solar cells due to sputter deposition of TCOs
Occurrence of Sharp Hydrogen Effusion Peaks of Hydrogenated Amorphous Silicon Film and Its Connection to Void Structures
CVD Boron Containing Glasses - An Attractive Alternative Diffusion Source for High Quality Emitters and Simplified Processing : A Review
Influence of the electrodes' distance upon the electrical, optical and structural properties of PECV-deposited hydrogenated amorphous silicon films for heterojunction solar cell application
Bias-plasma Assisted RF Magnetron Sputter Deposition of Hydrogen-less Amorphous Silicon
Electrical, optical and structural investigation of low-temperature PECV-deposited hydrogenated amphorous silicon-oxynitride films for surface passivation of crystalline silicon solar cells
Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films
Morphology and Hydrogen in Passivating Amorphous Silicon Layers