Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
In: Physica Status Solidi (C) ; 13 (2016), 10-12. - S. 724-728. - ISSN 1610-1634. - eISSN 1610-1642
- Klassifikation
-
Physik
- Ereignis
-
Veröffentlichung
- (wo)
-
Konstanz
- (wer)
-
Bibliothek der Universität Konstanz
- (wann)
-
2016
- Urheber
- URN
-
urn:nbn:de:bsz:352-0-373994
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:26 MESZ
Datenpartner
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Beteiligte
- Gerke, Sebastian
- Micard, Gabriel
- Job, Reinhart
- Hahn, Giso
- Terheiden, Barbara
- Bibliothek der Universität Konstanz
Entstanden
- 2016
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