Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
In: Physica Status Solidi (C) ; 13 (2016), 10-12. - S. 724-728. - ISSN 1610-1634. - eISSN 1610-1642
- Classification
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Physik
- Event
-
Veröffentlichung
- (where)
-
Konstanz
- (who)
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Bibliothek der Universität Konstanz
- (when)
-
2016
- Creator
- URN
-
urn:nbn:de:bsz:352-0-373994
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:26 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Gerke, Sebastian
- Micard, Gabriel
- Job, Reinhart
- Hahn, Giso
- Terheiden, Barbara
- Bibliothek der Universität Konstanz
Time of origin
- 2016
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