- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783540639763
3540639764
- Dimensions
-
24 cm
- Extent
-
XIV, 527 S.
- Edition
-
2., completely rev. and updated ed.
- Language
-
Englisch
- Notes
-
Ill., graph. Darst.
Literaturverz. S. 449 - 514
- Bibliographic citation
-
Springer series in optical sciences ; Vol. 45
- Keyword
-
Rasterelektronenmikroskopie
- Event
-
Veröffentlichung
- (where)
-
Berlin, Heidelberg, New York, Barcelona, Budapest, Hong Kong, London, Milan, Paris, Singapore, Tokyo
- (who)
-
Springer
- (when)
-
1998
- Creator
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.03.2025, 11:39 AM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Reimer, Ludwig
- Springer
Time of origin
- 1998
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