Transmission electron microscopy : physics of image formation and microanalysis
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783540504993
3540504990
9780387504995
0387504990
- Maße
-
24 cm
- Umfang
-
XIII, 547 S.
- Ausgabe
-
2. ed.
- Sprache
-
Deutsch
- Anmerkungen
-
263 Ill. u. graph. Darst.
Literaturverz. S. 465 - 536
- Erschienen in
-
Springer series in optical sciences ; Vol. 36
- Schlagwort
-
Durchstrahlungselektronenmikroskopie
Elektronenmikroskopie
Elektronenmikroskopie
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin, Heidelberg, New York, London, Paris, Tokyo
- (wer)
-
Springer
- (wann)
-
1989
- Urheber
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 14:23 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Reimer, Ludwig
- Springer
Entstanden
- 1989
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