- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783832525187
- Maße
-
21 cm
- Umfang
-
V, 85 S.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Zugl.: Zürich, Techn. Hochsch., Diss., 2010
- Erschienen in
-
Applied electron microscopy ; Bd. 9
- Schlagwort
-
Rasterelektronenmikroskop
Feldemissionsmikroskopie
Nahfeld
Festkörperoberfläche
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 13:50 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Objekttyp
- Hochschulschrift
Beteiligte
- Kirk, Taryl Leaton
- Logos-Verl.
Entstanden
- 2010
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