- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783921800928
- Maße
-
25 cm
- Umfang
-
245 Seiten
- Sprache
-
Englisch
- Anmerkungen
-
Illustrationen
- Erschienen in
-
Englera ; 32
- Schlagwort
-
Orchideen
Orchideenartige
Klassifikation
Taxonomie
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin-Dahlem
- (wer)
-
Botanic Garden and Botanical Museum Berlin-Dahlem
- (wann)
-
December 2014
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 13:48 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Barthlott, Wilhelm
- Große-Veldmann, Bernadette
- Korotkova, Nadja
- Botanic Garden and Botanical Museum Berlin-Dahlem
Entstanden
- December 2014
Ähnliche Objekte (12)
Material Contrast by Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron Microscopy
Materials Testing - Scanning Electron Microscopy
Near field emission scanning electron microscopy
Feature adaptive sampling for scanning electron microscopy
New horizons of applied scanning electron microscopy
Atlas of scanning electron microscopy in microbiology
Scanning Transmission Electron Microscopy in a Scanning Electron Microscope: Electron-Beam Broadening, Contamination, and Investigation of ZIF-8 by Correlative Electron Microscopy
In situ scanning electron microscopy in materials research
Scanning electron microscopy of normal and abnormal human skin
Scanning electron microscopy : physics of image formation and microanalysis
Scanning electron microscopy : physics of image formation and analysis
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
Material Contrast by Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron Microscopy
Materials Testing - Scanning Electron Microscopy
Near field emission scanning electron microscopy
Feature adaptive sampling for scanning electron microscopy
New horizons of applied scanning electron microscopy
Atlas of scanning electron microscopy in microbiology
Scanning Transmission Electron Microscopy in a Scanning Electron Microscope: Electron-Beam Broadening, Contamination, and Investigation of ZIF-8 by Correlative Electron Microscopy
In situ scanning electron microscopy in materials research
Scanning electron microscopy of normal and abnormal human skin
Scanning electron microscopy : physics of image formation and microanalysis
Scanning electron microscopy : physics of image formation and analysis
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
Material Contrast by Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron Microscopy
Materials Testing - Scanning Electron Microscopy
Near field emission scanning electron microscopy
Feature adaptive sampling for scanning electron microscopy
New horizons of applied scanning electron microscopy
Atlas of scanning electron microscopy in microbiology
Scanning Transmission Electron Microscopy in a Scanning Electron Microscope: Electron-Beam Broadening, Contamination, and Investigation of ZIF-8 by Correlative Electron Microscopy
In situ scanning electron microscopy in materials research
Scanning electron microscopy of normal and abnormal human skin
Scanning electron microscopy : physics of image formation and microanalysis
Scanning electron microscopy : physics of image formation and analysis