- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783540135302
3540135308
9780387135304
0387135308
- Maße
-
24 cm
- Umfang
-
XVIII, 457 S.
- Sprache
-
Englisch
- Anmerkungen
-
247 Ill. u. graph. Darst.
Literaturverz. S. 405 - 446
- Erschienen in
-
Springer series in optical sciences ; Vol. 45
- Schlagwort
-
Rasterelektronenmikroskopie
Elektronenmikroskopie
Rasterelektronenmikroskopie
Elektronenmikroskopie
Rasterelektronenmikroskopie
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin, Heidelberg, New York, Tokyo
- (wer)
-
Springer
- (wann)
-
1985
- Urheber
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 13:54 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Reimer, Ludwig
- Springer
Entstanden
- 1985
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