- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783540639763
3540639764
- Maße
-
24 cm
- Umfang
-
XIV, 527 S.
- Ausgabe
-
2., completely rev. and updated ed.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Literaturverz. S. 449 - 514
- Erschienen in
-
Springer series in optical sciences ; Vol. 45
- Schlagwort
-
Rasterelektronenmikroskopie
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin, Heidelberg, New York, Barcelona, Budapest, Hong Kong, London, Milan, Paris, Singapore, Tokyo
- (wer)
-
Springer
- (wann)
-
1998
- Urheber
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.03.2025, 11:39 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Reimer, Ludwig
- Springer
Entstanden
- 1998
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