Recombination and Charge Collection at Nickel Silicide Precipitates in Silicon Studied by Electron Beam‐Induced Current
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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Recombination and Charge Collection at Nickel Silicide Precipitates in Silicon Studied by Electron Beam‐Induced Current ; day:08 ; month:07 ; year:2021 ; extent:8
Physica status solidi / B. B, Basic solid state physics ; (08.07.2021) (gesamt 8)
- Creator
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Saring, Philipp
Seibt, Michael
- DOI
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10.1002/pssb.202100142
- URN
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urn:nbn:de:101:1-2021070915092054437829
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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14.08.2025, 10:46 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Saring, Philipp
- Seibt, Michael