Recombination and Charge Collection at Nickel Silicide Precipitates in Silicon Studied by Electron Beam‐Induced Current

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Recombination and Charge Collection at Nickel Silicide Precipitates in Silicon Studied by Electron Beam‐Induced Current ; day:08 ; month:07 ; year:2021 ; extent:8
Physica status solidi / B. B, Basic solid state physics ; (08.07.2021) (gesamt 8)

Creator
Saring, Philipp
Seibt, Michael

DOI
10.1002/pssb.202100142
URN
urn:nbn:de:101:1-2021070915092054437829
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 10:46 AM CEST

Data provider

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Associated

  • Saring, Philipp
  • Seibt, Michael

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