- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
Sputter Depth Profiling of Thin Films ; volume:17 ; number:1-2 ; year:1998 ; pages:13-28
High temperature materials and processes ; 17, Heft 1-2 (1998), 13-28
- Creator
-
Hofmann,, Siegfried
- DOI
-
10.1515/HTMP.1998.17.1-2.13
- URN
-
urn:nbn:de:101:1-2501260514367.363192417226
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:25 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Hofmann,, Siegfried
Other Objects (12)
Growth characteristics of sputter-deposited UPt3 thin films
Magnetron sputter deposition of nanostructured AlN thin films
Auger depth profiling and factor analysis of sputter induced altered layers in SiC
Cell adhesion on NiTi thin film sputter-deposited meshes
Stress and microstructure of sputter deposited thin copper and niobium films
Stress and microstructure of sputter deposited thin copper and niobium films
Growth, structure and stability of sputter-deposited MoS2 thin films
AES sputter depth profiling of composition microprofiles induced by low energy ion bombardement in binary alloys
Thin film and depth profile analysis
Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces
Neutron depth profiling
CuInS2 thin films for photovoltaic : RF reactive sputter deposition and characterization
Growth characteristics of sputter-deposited UPt3 thin films
Magnetron sputter deposition of nanostructured AlN thin films
Auger depth profiling and factor analysis of sputter induced altered layers in SiC
Cell adhesion on NiTi thin film sputter-deposited meshes
Stress and microstructure of sputter deposited thin copper and niobium films
Stress and microstructure of sputter deposited thin copper and niobium films
Growth, structure and stability of sputter-deposited MoS2 thin films
AES sputter depth profiling of composition microprofiles induced by low energy ion bombardement in binary alloys
Thin film and depth profile analysis
Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces
Neutron depth profiling
CuInS2 thin films for photovoltaic : RF reactive sputter deposition and characterization
Growth characteristics of sputter-deposited UPt3 thin films
Magnetron sputter deposition of nanostructured AlN thin films
Auger depth profiling and factor analysis of sputter induced altered layers in SiC
Cell adhesion on NiTi thin film sputter-deposited meshes
Stress and microstructure of sputter deposited thin copper and niobium films
Stress and microstructure of sputter deposited thin copper and niobium films
Growth, structure and stability of sputter-deposited MoS2 thin films
AES sputter depth profiling of composition microprofiles induced by low energy ion bombardement in binary alloys
Thin film and depth profile analysis
Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces
Neutron depth profiling