- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783540133209
3540133208
9780387133201
0387133208
- Dimensions
-
25 cm
- Extent
-
XI, 205 S.
- Language
-
Englisch
- Notes
-
99 Ill. u. graph. Darst.
Literaturangaben
- Bibliographic citation
-
Topics in current physics ; 37
- Keyword
-
Dünne Schicht
Oberfläche
Tiefenprofil
Elektronenspektroskopie
Sekundärionen-Massenspektrometrie
Oberfläche
Elementaranalyse
Spektroskopie
Dünne Schicht
Oberfläche
Tiefenprofilmessung
Elektronenspektroskopie
Sekundärionen-Massenspektrometrie
Elementaranalyse
Spektroskopie
- Event
-
Veröffentlichung
- (where)
-
Berlin, Heidelberg, New York, Tokyo
- (who)
-
Springer
- (when)
-
1984
- Creator
-
Etzkorn, Heinz-Werner
- Contributor
-
Oechsner, Hans
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.06.2025, 2:23 PM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Etzkorn, Heinz-Werner
- Oechsner, Hans
- Springer
Time of origin
- 1984
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