Deterministic built-in self-test with guarenteed test quality and low overhead
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783183347209
3183347202
- Maße
-
21 cm
- Umfang
-
X, 127 S.
- Ausgabe
-
Als Ms. gedr.
- Sprache
-
Englisch
- Anmerkungen
-
graph. Darst.
Literaturverz. S. 114 - 127
- Erschienen in
-
Fortschritt-Berichte VDI / 20 / Verein Deutscher Ingenieure ; Nr. 347, Reihe 20, Rechnerunterstützte Verfahren
- Schlagwort
-
Built-in self test
Logiksynthese
Testmustergenerator
- Ereignis
-
Veröffentlichung
- (wo)
-
Düsseldorf
- (wer)
-
VDI-Verl.
- (wann)
-
2002
- Urheber
-
Kiefer, Gundolf
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 13:37 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Kiefer, Gundolf
- VDI-Verl.
Entstanden
- 2002
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