Hochschulschrift
A BIST (built-in self-test) strategy for mixed-signal integrated circuits
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Dimensions
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30 cm
- Extent
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X, 172 S.
- Language
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Englisch
- Notes
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graph. Darst.
Erlangen, Nürnberg, Univ., Diss., 2004
- Classification
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Ingenieurwissenschaften und Maschinenbau
- Keyword
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Mixed-Signal-Schaltung
Built-in self test
Mixed-Signal-Schaltung
Analog-Digital-Umsetzer
Digital-Analog-Umsetzer
Testbarkeit
ADC DAC Mixed-Signal Schaltungen Test BIST
- Creator
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.06.2025, 1:47 PM CEST
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Object type
- Hochschulschrift
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