Hochschulschrift
A BIST (built-in self-test) strategy for mixed-signal integrated circuits
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Maße
-
30 cm
- Umfang
-
X, 172 S.
- Sprache
-
Englisch
- Anmerkungen
-
graph. Darst.
Erlangen, Nürnberg, Univ., Diss., 2004
- Klassifikation
-
Ingenieurwissenschaften und Maschinenbau
- Schlagwort
-
Mixed-Signal-Schaltung
Built-in self test
Mixed-Signal-Schaltung
Analog-Digital-Umsetzer
Digital-Analog-Umsetzer
Testbarkeit
ADC DAC Mixed-Signal Schaltungen Test BIST
- Urheber
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 13:47 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Objekttyp
- Hochschulschrift
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