Hochschulschrift
Data compression techniques for concurrent error detection and built-in self test
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Maße
-
29 cm
- Umfang
-
159 S.
- Sprache
-
Englisch
- Anmerkungen
-
graph. Darst.
Potsdam, Univ., Diss., 1995
- Schlagwort
-
VLSI
Fehlererkennung
Nebenläufigkeit
Datenkompression
Testmustergenerierung
Fehlermodell
- Urheber
-
Tarnick, Steffen
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 14:09 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Objekttyp
- Hochschulschrift
Beteiligte
- Tarnick, Steffen
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