Hochschulschrift
Monitoring Concepts for Degradation Effects in Digital CMOS Circuits
- Alternative title
-
Überwachungskonzepte für Alterungseffekte in digitalen CMOS Schaltungen
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
München, Technische Universität München, Diss., 2015
- Classification
-
Elektrotechnik, Elektronik
- Event
-
Veröffentlichung
- (where)
-
München
- (who)
-
Universitätsbibliothek der TU München
- (when)
-
2015
- Creator
- Contributor
- URN
-
urn:nbn:de:bvb:91-diss-20150729-1241463-1-6
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:53 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Hochschulschrift
Associated
- Pour Aryan, Nasim
- Schmitt-Landsiedel, Doris
- Stechele, Walter
- Universitätsbibliothek der TU München
Time of origin
- 2015
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