Phase Transformations Driving Biaxial Stress Reduction During Wake‐Up of Ferroelectric Hafnium Zirconium Oxide Thin Films

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Standort
Deutsche Nationalbibliothek Frankfurt am Main
Umfang
Online-Ressource
Sprache
Englisch

Erschienen in
Phase Transformations Driving Biaxial Stress Reduction During Wake‐Up of Ferroelectric Hafnium Zirconium Oxide Thin Films ; day:21 ; month:06 ; year:2024 ; extent:9
Advanced electronic materials ; (21.06.2024) (gesamt 9)

Urheber
Jaszewski, Samantha T.
Fields, Shelby S.
Calderon, Sebastian
Aronson, Benjamin L.
Beechem, Thomas E.
Kelley, Kyle P.
Zhang, Casey
Lenox, Megan K.
Brummel, Ian A.
Dickey, Elizabeth C.
Ihlefeld, Jon F.

DOI
10.1002/aelm.202400151
URN
urn:nbn:de:101:1-2406221420384.096770406874
Rechteinformation
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Letzte Aktualisierung
14.08.2025, 10:50 MESZ

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Beteiligte

  • Jaszewski, Samantha T.
  • Fields, Shelby S.
  • Calderon, Sebastian
  • Aronson, Benjamin L.
  • Beechem, Thomas E.
  • Kelley, Kyle P.
  • Zhang, Casey
  • Lenox, Megan K.
  • Brummel, Ian A.
  • Dickey, Elizabeth C.
  • Ihlefeld, Jon F.

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