Monografie
Detailed study of electromigration induced damage in Al and AlCuSi interconnects
- Sprache
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Englisch
- Identifier
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1049700457
Thema
Oberflächenschaden ; Elektromigration ; Studie
Beteiligte Personen und Organisationen
- URN
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
26.01.2023, 13:53 MEZ
Objekttyp
- Monografie
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