Monografie
Electromigration failure by shape change of voids in bamboo lines
- Sprache
-
Englisch
- Anmerkungen
-
In: Journal of applied physics, Vol. 104, No. 17, 1996. - Woodbury, NY : American Inst. of Physics
- Standort
-
München, Bayerische Staatsbibliothek -- 4 Z 53.18-76,3/4#S.1563-1571
Beteiligte Personen und Organisationen
Erschienen
Woodbury, NY : American Inst. of Physics, 1994
- URN
-
urn:nbn:de:bvb:12-bsb00086573-2
- Letzte Aktualisierung
-
16.04.2024, 13:55 MESZ
Entstanden
- Woodbury, NY : American Inst. of Physics, 1994
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