- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
In: Materials reliability in microelectronics II : symposium held April 27 - May 1, 1992, San Francisco, California, U.S.A. / ed.: C. V. Thompson ... - Pittsburgh, Pa. : Materials Research Society, 1992. - (Materials Research Society symposium proceedings ; 265), S. 131-142
- Klassifikation
-
Ingenieurwissenschaften und Maschinenbau
- Schlagwort
-
Mikrostruktur ; Elektromigration
- Ereignis
-
Veröffentlichung
- (wo)
-
Saarbrücken
- (wer)
-
Saarländische Universitäts- und Landesbibliothek
- (wann)
-
2009
- Urheber
- URN
-
urn:nbn:de:bsz:291-scidok-20083
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:49 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Sanchez, J. E.
- Arzt, Eduard
- Saarländische Universitäts- und Landesbibliothek
Entstanden
- 2009
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