Applied scanning probe methods, 2.. Scanning probe microscopy techniques

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Location: Deutsche Nationalbibliothek Frankfurt am Main

ISBN: 9783540262428
3540262423

Extent: XLIII, 420 S.

Language: Englisch

Notes: Ill., graph. Darst.

Bibliographic citation: Applied scanning probe methods

Classification: Naturwissenschaften
Ingenieurwissenschaften und Maschinenbau

Event: Veröffentlichung

(where): Berlin, Heidelberg, New York

(who): Springer

(when): 2006

Table of contents: https://d-nb.info/974911321/04

Rights: Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.

Last update: 11.06.2025, 2:26 PM CEST

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Springer

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2006

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Applied scanning probe methods, 2.. Scanning probe microscopy techniques

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Other Objects (12)

Applied scanning probe methods, 8.. Scanning probe microscopy techniques

Applied scanning probe methods, 11.. Scanning probe microscopy techniques

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Applied scanning probe methods, 9.. Characterization

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Applied scanning probe methods, 12.. Characterization

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Applied scanning probe methods, 12.. Characterization

Applied scanning probe methods, 6.. Characterization

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