Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783662452394
3662452391
- Maße
-
25 cm
- Umfang
-
XV, 382 S.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Literaturangaben
- Schlagwort
-
Rastersondenmikroskopie
Rasterkraftmikroskopie
Rastertunnelmikroskopie
- Ereignis
-
Veröffentlichung
- (wo)
-
Heidelberg, New York, NY, Dordrecht, London, Berlin
- (wer)
-
Springer
- (wann)
-
2015
- Urheber
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.03.2025, 12:18 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Voigtländer, Bert
- Springer
Entstanden
- 2015
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