- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Maße
-
21 cm
- Umfang
-
VII, 121 S.
- Ausgabe
-
Als Ms. gedr.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Zugl.: Stuttgart, Univ., Diss., 2001
- Erschienen in
-
Bericht / Max-Planck-Institut für Metallforschung ; Nr. 112
- Schlagwort
-
Mikrosystemtechnik
Silber
Dünne Schicht
Siliciumdioxid
Materialermüdung
Size-Effekt
Kupfer
Dünne Schicht
Polyimide
Materialermüdung
Werkstoffschädigung
Size-Effekt
- Ereignis
-
Veröffentlichung
- (wo)
-
Stuttgart
- (wer)
-
Max-Planck-Inst. für Metallforschung
- (wann)
-
2001
- Beteiligte Personen und Organisationen
-
Schwaiger, Ruth
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 13:57 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Objekttyp
- Hochschulschrift
Beteiligte
- Schwaiger, Ruth
- Max-Planck-Inst. für Metallforschung
Entstanden
- 2001
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