Konferenzschrift | Kongress
Similarity-based pattern recognition : second international workshop ; proceedings
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783642391392
3642391397
- Maße
-
24 cm
- Umfang
-
X, 296 S.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Literaturangaben
- Erschienen in
-
Lecture notes in computer science ; 7953
- Schlagwort
-
Mustererkennung
Maschinelles Lernen
Ähnlichkeitsmaß
Cluster-Analyse
Ähnlichkeitssuche
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin, Heidelberg
- (wer)
-
Springer
- (wann)
-
2013
- Beteiligte Personen und Organisationen
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 13:49 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Objekttyp
- Konferenzschrift
- Kongress
Beteiligte
- Hancock, Edwin R.
- Pelillo, Marcello
- SIMBAD (2 : 2013 : York, UK)
- Springer
Entstanden
- 2013
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