Lock-in thermography : basics and use for evaluating electronic devices and materials
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783642264788
9783642024160
- Maße
-
25 cm
- Umfang
-
IX, 255 S.
- Ausgabe
-
2. ed.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Literaturangaben
- Erschienen in
-
Advanced microelectronics ; 10
- Klassifikation
-
Elektrotechnik, Elektronik
- Schlagwort
-
Infrarotthermographie
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin, Heidelberg
- (wer)
-
Springer
- (wann)
-
2010
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 14:23 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
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Beteiligte
Entstanden
- 2010
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