Lock-in thermography : basics and use for functional diagnostics of electronic components
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783540434399
3540434399
- Maße
-
24 cm
- Umfang
-
VIII, 193 S.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Literaturverz. S. 173 - 179
- Erschienen in
-
Advanced microelectronics ; 10
- Schlagwort
-
Infrarotthermographie
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin, Heidelberg, New York, Hong Kong, London, Milan, Paris, Tokyo
- (wer)
-
Springer
- (wann)
-
2003
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 14:16 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Breitenstein, Otwin
- Langenkamp, Martin
- Springer
Entstanden
- 2003
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