Predicting Atomic Force Microscopy Topography from Optical Microscopes Using Deep Learning
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
-
Englisch
- Erschienen in
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Predicting Atomic Force Microscopy Topography from Optical Microscopes Using Deep Learning ; day:20 ; month:12 ; year:2022 ; extent:9
Advanced intelligent systems ; (20.12.2022) (gesamt 9)
- Urheber
-
Jeong, Jaewoo
Kim, Taeyeong
Lee, Bong Jae
Lee, Jungchul
- DOI
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10.1002/aisy.202200317
- URN
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urn:nbn:de:101:1-2022122114053520835811
- Rechteinformation
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:25 MESZ
Datenpartner
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Beteiligte
- Jeong, Jaewoo
- Kim, Taeyeong
- Lee, Bong Jae
- Lee, Jungchul
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