Predicting Atomic Force Microscopy Topography from Optical Microscopes Using Deep Learning

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Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: Online-Ressource

Language: Englisch

Bibliographic citation: Predicting Atomic Force Microscopy Topography from Optical Microscopes Using Deep Learning ; day:20 ; month:12 ; year:2022 ; extent:9
Advanced intelligent systems ; (20.12.2022) (gesamt 9)

Creator: Jeong, Jaewoo
Kim, Taeyeong
Lee, Bong Jae
Lee, Jungchul

DOI: 10.1002/aisy.202200317

URN: urn:nbn:de:101:1-2022122114053520835811

Rights: Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 15.08.2025, 7:25 AM CEST

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Jeong, Jaewoo
Kim, Taeyeong
Lee, Bong Jae
Lee, Jungchul

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Predicting Atomic Force Microscopy Topography from Optical Microscopes Using Deep Learning

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Other Objects (12)

Predicting Atomic Force Microscopy Topography from Optical Microscopes Using Deep Learning

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