Atomic force acoustic microscopy reveals the influence of substrate stiffness and topography on cell behavior

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Atomic force acoustic microscopy reveals the influence of substrate stiffness and topography on cell behavior ; volume:10 ; pages:2329-2337
Beilstein journal of nanotechnology ; 10, 2329-2337

Classification
Ingenieurwissenschaften und Maschinenbau

DOI
10.3762/bjnano.10.223
URN
urn:nbn:de:101:1-2020112011474015729404
Rights
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:27 AM CEST

Data provider

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