Infrared Reflectance Analysis of Epitaxial n-Type Doped GaN Layers Grown on Sapphire
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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1556-276X
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Infrared Reflectance Analysis of Epitaxial n-Type Doped GaN Layers Grown on Sapphire ; volume:12 ; number:1 ; day:8 ; month:6 ; year:2017 ; pages:1-9 ; date:12.2017
Nanoscale research letters ; 12, Heft 1 (8.6.2017), 1-9, 12.2017
- Classification
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Physik
- Creator
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Tsykaniuk, Bogdan I.
- Contributor
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Nikolenko, Andrii S.
Strelchuk, Viktor V.
Naseka, Viktor M.
Mazur, Yuriy I.
Ware, Morgan E.
DeCuir, Eric A.
Sadovyi, Bogdan
Weyher, Jan L.
Jakiela, Rafal
Salamo, Gregory J.
Belyaev, Alexander E.
SpringerLink (Online service)
- DOI
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10.1186/s11671-017-2171-0
- URN
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urn:nbn:de:1111-201711027068
- Rights
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:36 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Tsykaniuk, Bogdan I.
- Nikolenko, Andrii S.
- Strelchuk, Viktor V.
- Naseka, Viktor M.
- Mazur, Yuriy I.
- Ware, Morgan E.
- DeCuir, Eric A.
- Sadovyi, Bogdan
- Weyher, Jan L.
- Jakiela, Rafal
- Salamo, Gregory J.
- Belyaev, Alexander E.
- SpringerLink (Online service)