Infrared Reflectance Analysis of Epitaxial n-Type Doped GaN Layers Grown on Sapphire

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
1556-276X
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Infrared Reflectance Analysis of Epitaxial n-Type Doped GaN Layers Grown on Sapphire ; volume:12 ; number:1 ; day:8 ; month:6 ; year:2017 ; pages:1-9 ; date:12.2017
Nanoscale research letters ; 12, Heft 1 (8.6.2017), 1-9, 12.2017

Classification
Physik

Creator
Tsykaniuk, Bogdan I.
Contributor
Nikolenko, Andrii S.
Strelchuk, Viktor V.
Naseka, Viktor M.
Mazur, Yuriy I.
Ware, Morgan E.
DeCuir, Eric A.
Sadovyi, Bogdan
Weyher, Jan L.
Jakiela, Rafal
Salamo, Gregory J.
Belyaev, Alexander E.
SpringerLink (Online service)

DOI
10.1186/s11671-017-2171-0
URN
urn:nbn:de:1111-201711027068
Rights
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:36 AM CEST

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Associated

  • Tsykaniuk, Bogdan I.
  • Nikolenko, Andrii S.
  • Strelchuk, Viktor V.
  • Naseka, Viktor M.
  • Mazur, Yuriy I.
  • Ware, Morgan E.
  • DeCuir, Eric A.
  • Sadovyi, Bogdan
  • Weyher, Jan L.
  • Jakiela, Rafal
  • Salamo, Gregory J.
  • Belyaev, Alexander E.
  • SpringerLink (Online service)

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