Konferenzschrift | Kongress
Structural, syntactic, and statistical pattern recognition : joint IAPR international workshop ; proceedings
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783642149795
- Maße
-
24 cm
- Umfang
-
XV, 758 S.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Literaturangaben
- Erschienen in
-
Lecture notes in computer science ; 6218
- Schlagwort
-
Mustererkennung
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin, Heidelberg, New York, NY
- (wer)
-
Springer
- (wann)
-
2010
- Beteiligte Personen und Organisationen
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.03.2025, 12:19 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Objekttyp
- Konferenzschrift
- Kongress
Beteiligte
- Hancock, Edwin R.
- International Association for Pattern Recognition
- SSPR (13 : 2010 : Çeşme)
- Springer
Entstanden
- 2010
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