Analysis of thickness-dependent optical parameters of a-Si:H/nc-Si:H multilayer thin films
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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2194-1467
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
-
online resource.
- Bibliographic citation
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Analysis of thickness-dependent optical parameters of a-Si:H/nc-Si:H multilayer thin films ; volume:6 ; number:4 ; day:26 ; month:10 ; year:2017 ; pages:1-6 ; date:11.2017
Materials for renewable and sustainable energy ; 6, Heft 4 (26.10.2017), 1-6, 11.2017
- Classification
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Ingenieurwissenschaften und Maschinenbau
- Creator
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Kherodia, Ashok
- Contributor
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Panchal, Ashish K.
SpringerLink (Online service)
- DOI
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10.1007/s40243-017-0107-3
- URN
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urn:nbn:de:1111-201801184272
- Rights
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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14.08.2025, 11:00 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Kherodia, Ashok
- Panchal, Ashish K.
- SpringerLink (Online service)
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