Analysis of thickness-dependent optical parameters of a-Si:H/nc-Si:H multilayer thin films
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
2194-1467
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
online resource.
- Erschienen in
-
Analysis of thickness-dependent optical parameters of a-Si:H/nc-Si:H multilayer thin films ; volume:6 ; number:4 ; day:26 ; month:10 ; year:2017 ; pages:1-6 ; date:11.2017
Materials for renewable and sustainable energy ; 6, Heft 4 (26.10.2017), 1-6, 11.2017
- Klassifikation
-
Ingenieurwissenschaften und Maschinenbau
- Urheber
-
Kherodia, Ashok
- Beteiligte Personen und Organisationen
-
Panchal, Ashish K.
SpringerLink (Online service)
- DOI
-
10.1007/s40243-017-0107-3
- URN
-
urn:nbn:de:1111-201801184272
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
- 14.08.0020, 10:00 MEZ
Datenpartner
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Beteiligte
- Kherodia, Ashok
- Panchal, Ashish K.
- SpringerLink (Online service)
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