Lock-in thermography : basics and use for functional diagnostics of electronic components
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783540434399
3540434399
- Dimensions
-
24 cm
- Extent
-
VIII, 193 S.
- Language
-
Englisch
- Notes
-
Ill., graph. Darst.
Literaturverz. S. 173 - 179
- Bibliographic citation
-
Advanced microelectronics ; 10
- Keyword
-
Infrarotthermographie
- Event
-
Veröffentlichung
- (where)
-
Berlin, Heidelberg, New York, Hong Kong, London, Milan, Paris, Tokyo
- (who)
-
Springer
- (when)
-
2003
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.06.2025, 2:16 PM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Breitenstein, Otwin
- Langenkamp, Martin
- Springer
Time of origin
- 2003
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