- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783540665830
3540665838
- Maße
-
24 cm
- Umfang
-
XXXI, 213 S.
- Sprache
-
Englisch
- Anmerkungen
-
graph. Darst.
Literaturverz. S. 201 - 208
- Erschienen in
-
Advanced microelectronics ; 7
- Schlagwort
-
Halbleiterbauelement
Rauschen
Kleinsignalverhalten
Numerisches Verfahren
Halbleiterbauelement
Rauschen
Großsignalverhalten
Numerisches Verfahren
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin, Heidelberg, New York, Barcelona, Hong Kong, London, Milan, Paris, Singapore, Tokyo
- (wer)
-
Springer
- (wann)
-
2001
- Urheber
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 13:58 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Bonani, Fabrizio
- Ghione, Giovanni
- Springer
Entstanden
- 2001
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