3D finite element modeling and simulation of industrial semiconductor devices including impact ionization
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
2190-5983
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
online resource.
- Bibliographic citation
-
3D finite element modeling and simulation of industrial semiconductor devices including impact ionization ; volume:5 ; number:1 ; day:14 ; month:3 ; year:2015 ; pages:1-18 ; date:12.2015
Journal of mathematics in industry ; 5, Heft 1 (14.3.2015), 1-18, 12.2015
- Creator
-
Mauri, Aurelio
Bortolossi, Andrea
Novielli, Giovanni
Sacco, Riccardo
- Contributor
-
SpringerLink (Online service)
- DOI
-
10.1186/s13362-015-0015-z
- URN
-
urn:nbn:de:101:1-2019070200380755087563
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
- 14.08.2025, 10:48 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Mauri, Aurelio
- Bortolossi, Andrea
- Novielli, Giovanni
- Sacco, Riccardo
- SpringerLink (Online service)
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