Hochschulschrift
Impact of the interface capacity on failure mechanisms and size effects in ferroelectric thin films
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783832250539
3832250530
- Maße
-
21 cm, 218 gr.
- Umfang
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VI, 138 S.
- Sprache
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Englisch
- Anmerkungen
-
Ill., graph. Darst.
Zugl.: Aachen, Techn. Hochsch., Diss., 2005
- Klassifikation
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Ingenieurwissenschaften und Maschinenbau
- Schlagwort
-
FRAM
Schichtkondensator
PZT
Ferroelektrikum
Size-Effekt
Werkstofffehler
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.03.2025, 12:18 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Objekttyp
- Hochschulschrift
Beteiligte
- Ellerkmann, Ulrich
- Shaker
Entstanden
- 2006
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