Simulation and Experimental Study on Anti-reflection Characteristics of Nano-patterned Si Structures for Si Quantum Dot-Based Light-Emitting Devices

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
1556-276X
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Simulation and Experimental Study on Anti-reflection Characteristics of Nano-patterned Si Structures for Si Quantum Dot-Based Light-Emitting Devices ; volume:11 ; number:1 ; day:29 ; month:6 ; year:2016 ; pages:1-7 ; date:12.2016
Nanoscale research letters ; 11, Heft 1 (29.6.2016), 1-7, 12.2016

Creator
Shao, Wenyi
Contributor
Lu, Peng
Li, Wei
Xu, Jun
Xu, Ling
Chen, Kunji
SpringerLink (Online service)

DOI
10.1186/s11671-016-1530-6
URN
urn:nbn:de:1111-2016070111632
Rights
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 10:55 AM CEST

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Associated

  • Shao, Wenyi
  • Lu, Peng
  • Li, Wei
  • Xu, Jun
  • Xu, Ling
  • Chen, Kunji
  • SpringerLink (Online service)

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