- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783540631828
3540631828
- Dimensions
-
24 cm
- Extent
-
XIV, 352 S.
- Language
-
Englisch
- Notes
-
graph. Darst.
Literaturverz. S. 325 - 341
- Bibliographic citation
-
Springer series in electronics and photonics ; Vol. 34
- Keyword
-
MOS-FET
ULSI
Dielektrische Schicht
SOI-Technik
- Event
-
Veröffentlichung
- (where)
-
Berlin, Heidelberg, New York, Barcelona, Budapest, Hong Kong, London, Milan, Paris, Santa Clara, Singapore, Tokyo
- (who)
-
Springer
- (when)
-
1997
- Creator
-
Hori, Takashi
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.03.2025, 12:34 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Hori, Takashi
- Springer
Time of origin
- 1997
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Processing approaches and gate dielectrics for AlGaN/GaN-based MISHFET
Carrier mobility in advanced channel materials using alternative gate dielectrics
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Crystal growth technology : semiconductors and dielectrics
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Simultaneous large-scale reliability analysis of ultra-thin MOS gate dielectrics using an automated test system
Processing approaches and gate dielectrics for AIGaN-, GaN-based MISHFET
Ultrathin organic thin-film transistors : investigating hybrid gate dielectrics and stable semiconductor monolayers
Processing approaches and gate dielectrics for AlGaN/GaN-based MISHFET
Carrier mobility in advanced channel materials using alternative gate dielectrics
Carrier mobility in advanced channel materials using alternative gate dielectrics
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Crystal growth technology : semiconductors and dielectrics
Properties of high-capacitance gate dielectrics and their application in low-voltage organic thin-film transistors
Methodology for electrical characterization of MOS devices with alternative gate dielectrics
Methodology for electrical characterization of MOS devices with alternative gate dielectrics
High-k gate dielectrics for CMOS technology
Simultaneous large-scale reliability analysis of ultra-thin MOS gate dielectrics using an automated test system
Processing approaches and gate dielectrics for AIGaN-, GaN-based MISHFET
Ultrathin organic thin-film transistors : investigating hybrid gate dielectrics and stable semiconductor monolayers
Processing approaches and gate dielectrics for AlGaN/GaN-based MISHFET
Carrier mobility in advanced channel materials using alternative gate dielectrics
Carrier mobility in advanced channel materials using alternative gate dielectrics
Carrier mobility in advanced channel materials using alternative gate dielectrics
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