Bi‐Stable Resistance Generation Mechanism for Oxygenated Amorphous Carbon‐Based Resistive Random‐Access Memory

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Bi‐Stable Resistance Generation Mechanism for Oxygenated Amorphous Carbon‐Based Resistive Random‐Access Memory ; day:17 ; month:01 ; year:2022 ; extent:12
Advanced electronic materials ; (17.01.2022) (gesamt 12)

Creator
Jin, Soo‐Min
Kim, Hea‐Jee
Woo, Dae‐Seong
Jung, Sung‐Mok
Kim, Dong‐Eon
Shim, Tae‐Hun
Park, Jea‐Gun

DOI
10.1002/aelm.202101083
URN
urn:nbn:de:101:1-2022011714175556760195
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:26 AM CEST

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Associated

  • Jin, Soo‐Min
  • Kim, Hea‐Jee
  • Woo, Dae‐Seong
  • Jung, Sung‐Mok
  • Kim, Dong‐Eon
  • Shim, Tae‐Hun
  • Park, Jea‐Gun

Other Objects (12)