- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783540133209
3540133208
9780387133201
0387133208
- Maße
-
25 cm
- Umfang
-
XI, 205 S.
- Sprache
-
Englisch
- Anmerkungen
-
99 Ill. u. graph. Darst.
Literaturangaben
- Erschienen in
-
Topics in current physics ; 37
- Schlagwort
-
Dünne Schicht
Oberfläche
Tiefenprofil
Elektronenspektroskopie
Sekundärionen-Massenspektrometrie
Oberfläche
Elementaranalyse
Spektroskopie
Dünne Schicht
Oberfläche
Tiefenprofilmessung
Elektronenspektroskopie
Sekundärionen-Massenspektrometrie
Elementaranalyse
Spektroskopie
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin, Heidelberg, New York, Tokyo
- (wer)
-
Springer
- (wann)
-
1984
- Urheber
-
Etzkorn, Heinz-Werner
- Beteiligte Personen und Organisationen
-
Oechsner, Hans
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 14:23 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Etzkorn, Heinz-Werner
- Oechsner, Hans
- Springer
Entstanden
- 1984
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