A review of demodulation techniques for multifrequency atomic force microscopy
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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A review of demodulation techniques for multifrequency atomic force microscopy ; volume:11 ; pages:76-91
Beilstein journal of nanotechnology ; 11, 76-91
- Klassifikation
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Ingenieurwissenschaften und Maschinenbau
- DOI
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10.3762/bjnano.11.8
- URN
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urn:nbn:de:101:1-2020112714492712592866
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
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15.08.2025, 07:25 MESZ
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