- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Erschienen in
-
Advanced atomic force microscopy techniques III ; volume:7 ; pages:1052-1054
Beilstein journal of nanotechnology ; 7, 1052-1054
- Klassifikation
-
Ingenieurwissenschaften und Maschinenbau
- DOI
-
10.3762/bjnano.7.98
- URN
-
urn:nbn:de:101:1-201701173564
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 10:47 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Ähnliche Objekte (12)
Advanced atomic force microscopy techniques
Advanced atomic force microscopy techniques V
Advanced atomic force microscopy techniques II
Atomic Force Microscopy (AFM)
Noncontact atomic force microscopy
A review of demodulation techniques for multifrequency atomic force microscopy
Advanced Atomic Force Microscopy: 3D Printed Micro-Optomechanical Sensor Systems
Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications
Amplitude modulation atomic force microscopy
Noncontact atomic force microscopy III
Progress in atomic force microscopy
Noncontact atomic force microscopy II
Advanced atomic force microscopy techniques
Advanced atomic force microscopy techniques V
Advanced atomic force microscopy techniques II
Atomic Force Microscopy (AFM)
Noncontact atomic force microscopy
A review of demodulation techniques for multifrequency atomic force microscopy
Advanced Atomic Force Microscopy: 3D Printed Micro-Optomechanical Sensor Systems
Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications
Amplitude modulation atomic force microscopy
Noncontact atomic force microscopy III
Progress in atomic force microscopy
Noncontact atomic force microscopy II
Advanced atomic force microscopy techniques
Advanced atomic force microscopy techniques V
Advanced atomic force microscopy techniques II
Atomic Force Microscopy (AFM)
Noncontact atomic force microscopy
A review of demodulation techniques for multifrequency atomic force microscopy
Advanced Atomic Force Microscopy: 3D Printed Micro-Optomechanical Sensor Systems
Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications
Amplitude modulation atomic force microscopy
Noncontact atomic force microscopy III
Progress in atomic force microscopy